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Impact of Reliability Issues and Process Variability in Neuromorphic CircuitsPublished in Institute of Electrical and Electronics Engineers Inc.
2022
Device reliability issues like BTI and HCI degrade the circuit performance over the device lifetime. The current work presents the degradation analysis of Axon Hillock (AH) and Simplified Leaky Integrate & Fire (SLIF) neuron circuits. The AH and SLIF circuits are implemented to generate spike output in two frequency ranges (KHz and MHz). We have analysed the impact of BTI, HCI and their combined effect on the circuit performance. Neuron circuits are characterized for their time-zero and aged performance by using spike frequency and spike output ON and OFF durations. 1000 Monte-Carlo (MC) simulations are performed to analyse the impact of time-zero process variability on the spike frequency. © 2022 IEEE.
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Published in Institute of Electrical and Electronics Engineers Inc.
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