Profiles
Research Units
Publications
Sign Up
Faculty Login
X
Conferences
Surface and interface analysis of MgxZn1-xO cubic and hexagonal phases by X-ray photoelectron and rutherford back scattering spectroscopies
S.S. Hullavarad
,
D.E. Pugel
,
Sankar Dhar
,
I. Takeuchi
,
T. Venkatesan
,
R.D. Vispute
Published in
2005
Volume: 2005
Pages: 195 - 196
Request full-text
Cite
Content may be subject to copyright.
Journal Details
Authors (1)
About the journal
Published in
Open Access
Impact factor
N/A
Authors (1)
Sankar Dhar
Physics
(SoNS) School of Natural Sciences
Recent publications
Influence of fractal and multifractal morphology on the wettability and reflectivity of crystalline-Si thin film surfaces as photon absorber layers for solar cell
Crystallization of Ge in ion-irradiated amorphous-Ge/Au thin films
An assessment on crystallization phenomena of Si in Al/a-Si thin films: Via thermal annealing and ion irradiation
Aluminum induced crystallization of amorphous Si: Thermal annealing and ion irradiation process
Get all the updates for this publication
Follow