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Multilevel resistance state of Cu/La2O3/Pt forming-free switching devices
Sarkar P.K., Prajapat M., Barman A., Bhattacharjee S., Roy A.
Published in Springer New York LLC
Volume: 51
Issue: 9
Pages: 4411 - 4418
An improved temperature dependent uniformity and reliability is investigated in La2O3/Pt-based memory devices with Cu top electrode. The microstructural investigation suggested the formation of polycrystalline La2O3 layer with stoichiometric chemical composition confirmed by X-ray photoelectron spectroscopy. Besides showing a forming-free resistive switching (RS) behaviour, the device also exhibited excellent multilevel capability with low switching voltage. A uniformity in the SET/RESET process was observed indicating enhanced switching stability. In addition, endurance with a high ON/OFF ratio of the order 103 and satisfactory data retention time over 104 s at 85 °C temperature confirmed the reliability of memory cells. Intrinsic tailoring of switching mechanism has been discussed in the framework of electric field-induced creation and annihilation of the reproducible Cu filaments in switching layer. The metallic nature of conducting filament has further been confirmed by temperature-dependent RS characterization. © 2016, Springer Science+Business Media New York.
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Published in Springer New York LLC
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